Born 1989, Lørenskog, Norway.
After graduating from high school Michael R. P. Ragazzon moved to Trondheim to study Engineering Cybernetics at the Norwegian University of Science and Technology (NTNU). In June 2013 he graduated as MSc (sivilingeniør), writing his thesis on the topic of nanopositioning in atomic force microscopy (AFM). He continued his research in AFM at the Department of Engineering Cybernetics, NTNU, and received the PhD degree in May 2018 under the supervision of Prof. Jan Tommy Gravdahl.
He is currently pursuing his interest in AFM as a postdoctoral researcher at NTNU. His main research interests include control theory and parameter estimation, and their application to extending the imaging capabilities of dynamic mode- and multifrequency atomic force microscopy.